By Topic

Large area thin film semiconductor detectors using multichannel counting Castor readout chip

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Hordequin, C. ; CEA, Centre d''Etudes Nucleaires de Saclay, Gif-sur-Yvette, France ; Foulon, F. ; Dulinski, W. ; Turchetta, R.
more authors

The performance of charged particle counters associating thin diamond or amorphous silicon (a-Si) detectors to Castor VLSI analog-digital circuits for the fabrication of large area detectors an reported. The 20 μm thick semiconductor detectors were synthesised using chemical vapour deposition (CVD) technique. Detectors of 2.5×2.5 cm2 area were segmented in 32 sub-areas of 13 mm2 in order to limit the electronic noise per reading channel. The 32 channel circuit was used to record the counting rate and the total number of counts on each segment. Such detection systems were tested under alpha particles (241Am) as well as under low energy beta particles (14C). The results show that large area detection systems can readily be fabricated at low cost by the association of an application specific readout chip (ASIC) with chemically vapour deposited semiconductor detectors

Published in:

Nuclear Science, IEEE Transactions on  (Volume:47 ,  Issue: 6 )