Cart (Loading....) | Create Account
Close category search window
 

Spectral purity and sources of noise in femtosecond-demodulation terahertz sources driven by Ti:sapphire mode-locked lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Demers, J.R. ; Dept. of Phys., Ohio State Univ., Columbus, OH, USA ; Goyette, T.M. ; Ferrio, K.B. ; Everitt, Henry O.
more authors

Direct measurements of the spectral purity in terahertz femtosecond-demodulation sources are reported and compared to theory. Because these sources operate at very high harmonics (~102-104) of the mode-lock frequency, a high spectral purity source is very dependent on a low-jitter femtosecond laser. Conversely, the spectral content of the terahertz sources provides detailed information about timing jitter and stringent tests of models used to describe the jitter. We find that both the behavior of the central core, and the noise skirts of the power spectrum of our sources, can be quantitatively related to measured ripple and continuum amplitude noise on the Ar+ pump laser by use of modulation theory

Published in:

Quantum Electronics, IEEE Journal of  (Volume:37 ,  Issue: 4 )

Date of Publication:

Apr 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.