Cart (Loading....) | Create Account
Close category search window
 

Optimization of a UV Cu+ laser excited by pulse-longitudinal Ne-CuBr discharge

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Vuchkov, N.K. ; Inst. of Solid State Phys., Bulgarian Acad. of Sci., Sofia, Bulgaria ; Temelkov, K.A. ; Zahariev, P.V. ; Sabotinov, N.V.

The discharge conditions for high average output power on four UV Cu+ lines at 248.6 252.9, 260.0, and 270.3 nm, in a nanosecond pulse-longitudinal Ne-CuBr discharge, have been investigated in two discharge tubes of different designs. A record average output power of 210 mW (and a peak pulse power of 1.7 W) on the 238.6-nm laser line, and of 270 mW for multiline operation has been obtained. An optical effect enhancing the 248.6-nm laser line power has been observed as the intensity of two Cu atom laser lines (510.6 and 578.2 nm) increases. It has been shown that the presence of Br atoms in the discharge leads to a fall of the Ne metastable density via Penning ionization and, hence, to a decrease of the Cu+ metastable density and an increase of the laser output

Published in:

Quantum Electronics, IEEE Journal of  (Volume:37 ,  Issue: 4 )

Date of Publication:

Apr 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.