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Large signal dielectric characterization measurement for integrated passive devices

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4 Author(s)
R. Chen ; Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; J. T. Strydom ; L. Zhao ; J. D. van Wyk

Many of the existing methods of dielectric characterization measurement are based on small signal measurement. Through those methods, some important information, such as dielectric constant at different voltages, a critical concern for integrating passive modules, cannot be obtained. This paper presents a new method to measure dielectric characterization under resonant and constant current conditions for ranges up to 850 V and 10 A. With this circuit, the characteristics of dielectric materials under representative large signal renditions and time down to 1 μs can be found

Published in:

Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE  (Volume:2 )

Date of Conference:

2001