Referenced Items are not available for this document.
Many of the existing methods of dielectric characterization measurement are based on small signal measurement. Through those methods, some important information, such as dielectric constant at different voltages, a critical concern for integrating passive modules, cannot be obtained. This paper presents a new method to measure dielectric characterization under resonant and constant current conditions for ranges up to 850 V and 10 A. With this circuit, the characteristics of dielectric materials under representative large signal renditions and time down to 1 μs can be found
Published in:
Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE
(Volume:2
)
Date of Conference: 2001
- Page(s):
- 1203 - 1209 vol.2
- Meeting Date :
- 04 Mar 2001-08 Mar 2001
- Print ISBN:
- 0-7803-6618-2
- INSPEC Accession Number:
- 6970909
- Conference Location :
- Anaheim, CA
- Digital Object Identifier :
- 10.1109/APEC.2001.912518
- Product Type:
- Conference Publications
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