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Large signal dielectric characterization measurement for integrated passive devices

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4 Author(s)
Chen, R. ; Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; Strydom, J.T. ; Lingyin Zhao ; van Wyk, J.D.

Many of the existing methods of dielectric characterization measurement are based on small signal measurement. Through those methods, some important information, such as dielectric constant at different voltages, a critical concern for integrating passive modules, cannot be obtained. This paper presents a new method to measure dielectric characterization under resonant and constant current conditions for ranges up to 850 V and 10 A. With this circuit, the characteristics of dielectric materials under representative large signal renditions and time down to 1 μs can be found

Published in:

Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE  (Volume:2 )

Date of Conference: