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Machine vision algorithms for automated inspection thin-film disk heads

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2 Author(s)
J. L. C. Sanz ; IBM Almaden Res. Lab., San Jose, CA, USA ; D. Petkovic

Machine vision algorithms and a supporting architecture that were integrated in a fully automated prototype system for disk head inspection are presented. Some specific methods are elaborated on, including the computation of the Hough transform and multicode masks in pipeline architectures, object segmentation in textured backgrounds, and matching of extracted defects with inspection specifications. Extensive experimental results are given.

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:10 ,  Issue: 6 )