Close category search window
 

Design and analysis of iris-coupled and dielectric-loaded 1/8-cut TE01-mode microwave bandpass filters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Amari, S. ; Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada ; Bornemann, J. ; Laisne, A. ; Vahldieck, R.

The design and analysis of iris-coupled and dielectric-loaded 1/8-cut TE01-mode filters is performed using globalized local solutions of Maxwell's equations as basis functions. It is found that this set of basis functions outperforms other edge-conditioned basis functions. To reduce the size of the filter and increase the Q factor of the resonators, dielectric rings with high dielectric constant are employed in the same design technique. The dimensions of the resonators are determined to accurately take into account the effect of coupling on their resonant frequencies, thereby reducing the need of tuning. Numerical results are compared with those obtained from the finite-element method (HP HFSS) and the mode-matching technique. Good agreement is demonstrated

Published in:
Microwave Theory and Techniques, IEEE Transactions on  (Volume:49 ,  Issue: 3 )

Date of Publication: Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.