Cart (Loading....) | Create Account
Close category search window
 

A 0.5-μm CMOS T/R switch for 900-MHz wireless applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Feng-Jung Huang ; Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA ; O, K.

A single-pole double-throw transmit/receive switch for 3.0-V applications has been fabricated in a 0.5-μm CMOS process. An analysis shows that substrate resistances and source/drain-to-body capacitances must be lowered to decrease insertion loss. The switch exhibits a 0.7-dB insertion loss, a 17-dBm power 1-dB compression point (P1 dB), and a 42-dB isolation at 928 MHz. The low insertion loss is achieved by optimizing the transistor widths and bias voltages, by minimizing the substrate resistances, and by dc biasing the transmit and receive nodes, which decreases the capacitances while increasing the power 1-dB compression point. The switch has adequate insertion loss, isolation, P1 dB, and IP3 for a number of 900-MHz ISM band applications requiring a moderate peak transmitter power level (~15 dBm)

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:36 ,  Issue: 3 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.