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Laser depth measurement using picosecond resolution time correlated single-photon counting

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3 Author(s)
Pellegrini, S. ; Dept. of Phys., Heriot-Watt Univ., Edinburgh, UK ; Buller, G.S. ; Wallace, A.M.

Summary form only given. In the last few years, depth profiling using a time-of-flight (TOF) system utilising the time-correlated single-photon counting has been successfully demonstrated. Previous work used the TOF system for very accurate scanning of surfaces at very short range (i.e. approximately 20 /spl mu/m depth resolution at 2 m). We have investigated the use of this technique for distance measurements.

Published in:

Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on

Date of Conference:

10-15 Sept. 2000