By Topic

High-speed, high-reliability planar-structure superlattice avalanche photodiodes for 10-Gb/s optical receivers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Watanabe, Isao ; Photonic & Wireless Devices Res. Labs., NEC Corp., Ibaraki, Japan ; Nakata, T. ; Tsuji, M. ; Makita, K.
more authors

This paper reports the planar-structure InAl-GaAs-InAlAs superlattice avalanche photodiodes (SL-APDs) with a Ti-implanted guard-ring, which were developed for a compact and high-sensitivity 10-Gb/s optical receiver application. The design and fabrication of the novel concept planar-structure including the Ti-implanted guard-ring are described. The characteristics of the planar APDs are 0.36 /spl mu/A dark current at a multiplication factor of 10, 67% quantum efficiency, 110-GHz gain-bandwidth (GB) product, 15-GHz top-bandwidth, and - 27.2-dBm sensitivity at 10 Gb/s. The reliability was preliminary tested and the lifetime of longer than 10/sup 7/ h at 50/spl deg/C was estimated. The dark current characteristics including its temperature dependence and the excess noise characteristics are also analyzed. All the obtained characteristics exhibit the practical availability of the planar SL-APDs in the 10-Gb/s trunk line optical receiver uses.

Published in:

Lightwave Technology, Journal of  (Volume:18 ,  Issue: 12 )