Cart (Loading....) | Create Account
Close category search window

Telegraph noise mechanism and LLG noise model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Chen, L. ; Seagate Technol. Inc., Bloomington, MN, USA ; Fernandez-de-Castro, J. ; Giusti, J. ; Fang, H.
more authors

A preliminary study on random telegraph noise (RTN) is made. RTN is defined as the magnetization states switching by thermal fluctuations. State jumping resulting in baseline shift from the media field could also be RTN-associated multi-states switching. Our analysis shows that the root cause of such magnetization multi-states could be due to: (1) free layer edge states switching caused by a weak PM field; (2) surface and/or interface roughness, especially the lapped air bearing surface (ABS); and (3) random defects in the stack layers. A thermal noise model with Landau-Lifshitz-Gilbert equation (LLG) was developed and was applied to RTN demonstration

Published in:

Magnetics, IEEE Transactions on  (Volume:36 ,  Issue: 5 )

Date of Publication:

Sep 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.