By Topic

Statistical fluctuations during magnetization reversal in Fe films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
E. Puppin ; Dipt. di Fisica, Politecnico di Milano, Italy ; S. Ricci

The statistical properties of Barkhausen noise in an epitaxial Fe film grown on MgO have been characterized with a focussed magnetooptical hysteresigraph. If the measurements are performed on a large region of the sample surface the jump amplitude ΔM follows a power law probability distribution: P(ΔM)=ΔM. The critical exponent α is equal to 1.1. This value is lower than previous observations on bulk samples and polycrystalline films. The same distribution measured from a region having 50 μm size consists of a series of well separated peaks. The connection between this scale length and the continuous behavior on a larger scale is discussed

Published in:

IEEE Transactions on Magnetics  (Volume:36 ,  Issue: 5 )