By Topic

Recording performance and tribological evaluation of FIB defined tape recording heads

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lakshmikumaran, Anand V. ; Storage Technol. Corp., Louisville, CO, USA ; Cates, J.C. ; Hungerford, G.A.

Aggressive growth in cartridge capacity in future generation tape drives requires amongst others, high linear recording and track densities. In order to improve the track misregistration (TMR) budget at smaller track pitches, the erase band and tolerances on the recorded track width need to be minimized. This can be achieved by “trimming” the write element to the desired track width by forming a longitudinal channel on either side of the clement on the tape bearing surface (TBS) using focused ion beam (FIB) milling. Cross-track measurements depict desired track widths with reduced forward-reverse track width asymmetry in the read-write-read head configuration. Investigation of the head/tape interface does not predict any undesirable effects. These channels capture debris and hence will reduce the recording loss, especially at higher linear recording densities, due to tape tenting over loose debris transported through the interface and near the recording elements. A conceptual channel design is presented that will further reduce debris near the recording elements during the life of the head

Published in:

Magnetics, IEEE Transactions on  (Volume:36 ,  Issue: 5 )