By Topic

Improved intensity interferometry method for measuring head-disk spacing down to contact

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xinqun Liu ; Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK ; W. Clegg ; Bo Liu ; Chongtow Chong

In this paper, we give a detailed analysis of the working principle, application limits, and potential problems of the intensity interferometry flying height testing, one of the most popularly-used flying height testing techniques. Then, phase-shift methods are proposed to improve the sensitivity of this technique when the head-disk spacing is below 10 nm or near contact. This is based on fabricating the glass testing disk to have a specified thickness, or having it coated with a specified thickness thin carbon film. Theoretical analysis, numerical evaluation, and experimental considerations are presented

Published in:

IEEE Transactions on Magnetics  (Volume:36 ,  Issue: 5 )