Cart (Loading....) | Create Account
Close category search window
 

Crystallographic and magnetic properties of CoCrPt/Cr films produced by pulsed laser deposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shima, M. ; Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA ; Ford, A.C. ; Ross, C.A.

The crystallographic structure and magnetic properties of CoCrPt(30 nm)/Cr(50 nm) films fabricated by pulsed laser deposition have been studied at various substrate temperatures and ion bombardment energies. Cr(002) texture is developed at 350–500° C where increased coercivity is observed from the Co-alloy layers, while Cr(110) texture is formed at 300° C. The average grain size of the Cr layers gradually increases with substrate temperature from ~10 nm to ~20 nm, which is comparable to that of sputtered films. A Cr(002) X-ray peak is not observed from films grown at 400° C with Ar ion bombardment (> 50 eV). The coercivity and squareness of the magnetic hysteresis loops decrease as the beam energy increases, which may be attributed to the absence of Cr(002) texture.

Published in:

Magnetics, IEEE Transactions on  (Volume:36 ,  Issue: 5 )

Date of Publication:

Sept 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.