Cart (Loading....) | Create Account
Close category search window

Effect of orientation ratio on recording performance for longitudinal thin film media

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hee, Ching Hian ; Data Storage Inst., Singapore ; Wang, Jian-Ping ; Gong, Hao ; Teck Seng Low

The effects of orientation ratio (OR) on longitudinal thin film media recording performance are studied via micromagnetic modeling. The OR of the media is controlled by the anisotropy axes distribution. Along the preferred anisotropy direction, the coercivity and the remanence increases with decreasing standard deviation of anisotropy distribution σ and gives rise to an OR as high as 90. Highly oriented media show an ultra low transition noise and high effective track width. However, it is observed that highly oriented media exhibits a large track edge bending which increases the track edge noise. Effect of saturation magnetization (Ms) on the recording pattern for highly oriented media (OR=22.5) is investigated. Low magnetization is found to induce even lower transition noise and slightly higher effective track width. Edge percolation is observed when Ms increases up to 800 emu/cm3. However, the noise magnitude at this edge does not change much when Ms, is decreased to 200 emu/cm3

Published in:

Magnetics, IEEE Transactions on  (Volume:36 ,  Issue: 5 )

Date of Publication:

Sep 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.