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Refractive index profiling of optical waveguides using near-field scanning optical microscopy

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9 Author(s)
L. Dhar ; AT&T Bell Labs., Murray Hill, NJ, USA ; H. J. Lee ; E. J. Laskowski ; S. K. Buratto
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We present a method in which we take advantage of the high spatial resolution and experimental simplicity afforded by near-field scanning optical microscopy (NSOM) to determine the refractive index profiles of optical waveguides. We use NSOM to measure the near-field intensities of the guided modes in planar waveguides and optical fibers and calculate numerically, from the measured intensities, the refractive index distributions.

Published in:

Optical Fiber Communications, 1996. OFC '96

Date of Conference:

25 Feb.-1 March 1996