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Displacement measurement with submicron resolution using photo-electromotive force effect and frequency-modulated lasers

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7 Author(s)
Jin, F. ; Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA ; Khurgin, J.B. ; Wang, C.-C. ; Trivedi, S.
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Summary form only given.Two noncollinear coherent light waves interfering inside a semi-insulating semiconductor form an optical pattern (grating). Transient photoelectromotive force (photo-EMF) current can be generated when the phase of the grating is changed. Attractive features of the photo-EMF technique include ruggedness and comparative simplicity of system setup and signal processing. It has been successfully incorporated in vibrometry, displacement measurement, etc. We report a novel scheme for wide range and the high-resolution displacement measurement with photo-EMF effect that requires no moving component or complicated signal processing.

Published in:

Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on

Date of Conference:

7-12 May 2000

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