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A direct code error calibration technique for two-step flash A/D converters

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2 Author(s)
Seung-Hoon Lee ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Bang-Sup Song

The authors propose a direct code error calibration technique to improve linearities of flash-type analog-to-digital converters (ADCs). Simulation results of the proposed calibration algorithm based on a capacitor-array multiplying digital-to-analog converter (MDAC) predict that self-calibrating two-step flash ADCs with more than 12 bits of linearity are feasible

Published in:

Circuits and Systems, IEEE Transactions on  (Volume:36 ,  Issue: 6 )

Date of Publication:

Jun 1989

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