Mechanism for single-event burnout of bipolar transistors

The mechanism for single-event burnout (SEB) of bipolar junction transistors (BJTs) was investigated with EPICS (Energetic Particle Induced Charge Spectroscopy) technique. The result indicated that the SEBs were triggered by newly identified electron injection mechanism that could not be predicted by usual numerical device simulators. Additionally the two stage SEB mechanism was proposed for BJTs.