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A model for single-event transients in comparators

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4 Author(s)
Johnston, A.H. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Swift, G.M. ; Miyahira, T.F. ; Edmonds, L.D.

A two-step modeling approach is developed for single-event transients in linear circuits that uses the PISCES device simulation program to calculate transient currents in key internal transistor structures. Those currents are then applied at the circuit level using the SPICE circuit analysis program. The results explain the dependence of transients on input differential voltage, as well as the dependence of transient signals on output loading conditions. Error rate predictions based on laboratory testing and modeling are in close agreement with the observed number of “trips” in comparators within power control modules that have operated in a deep space environment for nearly three years

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Nuclear Science, IEEE Transactions on  (Volume:47 ,  Issue: 6 )