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Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection

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3 Author(s)
Velazco, R. ; CNRS, Grenoble, France ; Rezgui, S. ; Ecoffet, R.

This paper investigates an approach to study the effects of upsets on the operation of microprocessor-based digital architectures. The method is based on the injection of bit-flips, randomly in time and location by using the capabilities of typical application boards. Experimental results, obtained on programs running on two different digital boards, built around an 80C51 microcontroller and a 320C50 Digital Signal Processor, illustrate the potentialities of this new strategy

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Nuclear Science, IEEE Transactions on  (Volume:47 ,  Issue: 6 )