Cart (Loading....) | Create Account
Close category search window

Automatic flaw detection in textiles using a Neyman-Pearson detector

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mamic, G. ; Space Centre for Satellite Navigation, Queensland Univ. of Technol., Brisbane, Qld., Australia ; Bennamoun, M.

A system for the automated visual inspection of textiles is discussed. The system consists of two main components, (1) the extraction of the texture features utilising the Karhunen-Loeve (KL) transform which provides optimal compression of the image data into a feature vector and (2) the detection of the flaw patterns using a Neyman-Pearson detector, which maximises the rate of detection for a specified false alarm rate. The performance of the system was evaluated on various fabrics and different types of textile flaws. The results indicate that the system can detect flaws which vary drastically in physical dimension and nature with a very low false alarm rate. Experimental results in the paper demonstrate the performance of the detector on some typical textile flaws

Published in:

Pattern Recognition, 2000. Proceedings. 15th International Conference on  (Volume:4 )

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.