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Fault detection and location using IDD waveform analysis

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2 Author(s)
Muhammad, K. ; Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Roy, K.

This paper shows that IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 1 )