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A parallel built-in self-diagnostic method for embedded memory buffers

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3 Author(s)
Huang, D.C. ; Dept. of Comput. Sci., Nat. Chung-Cheng Univ., Taiwan ; Jone, W.B. ; Das, S.R.

In this paper, we propose a new built-in self-diagnosis (BISD) method to simultaneously diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial interfacing technique is proposed to deal with such an issue. By tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolerable diagnostic time, and high diagnostic coverage

Published in:

VLSI Design, 2001. Fourteenth International Conference on

Date of Conference:

2001