Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

An efficient parallel transparent BIST method for multiple embedded memory buffers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Huang, D.C. ; Dept. of Comput. Sci., Nat. Chung-Cheng Univ., Taiwan ; Jone, W.B. ; Das, S.R.

In this paper, we propose a new transparent built-in self-test (TBIST) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent test interface is designed to perform testing in the normal mode and to cope with nested interrupts in a realtime manner. The circular scan test interface facilitates the processes of both test pattern generation and signature analysis. By tolerating redundant read/write/shift operations, we develop a new march algorithm called TRSMarch to achieve the goals of low hardware overhead, short test time, and high fault coverage

Published in:

VLSI Design, 2001. Fourteenth International Conference on

Date of Conference:

2001