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A technology development SRAM approach with DFM considerations

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12 Author(s)
Craig, M. ; Testchip Technol. Inc., Dallas, TX, USA ; Deshazo, D. ; Prior, S. ; Tranchina, B.
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A technology development SRAM (TDSRAMTM) has been highly effective in rapid process technology development, debug, and yield ramp on an advanced CMOS, 0.18 μm foundry process technology. TDSRAM is seen to accelerate FEOL and BEOL process debug using technology-oriented design and test approaches while minimizing inherent functional risks associated with IP-like designs at early stages of new technology development programs. Smart array design approaches have proven effective in directing immediate and focused failure analysis activities for rapid identification of root cause failure mechanisms

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI

Date of Conference:

2000