By Topic

Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
B. Shaer ; Dept. of Electr. & Comput. Eng., Minnesota Univ., Duluth, MN, USA ; D. Landis ; A. Al-Arian

This brief introduces a partitioning algorithm, which facilitates pseudoexhaustive testing, to detect and locate faults in digital VLSI circuits. The algorithm is based on an analysis of circuit's primary input cones and fanout (PIFAN) values. An invasive approach is employed, which creates logical and physical partitions by automatically inserting reconfigurable test cells and multiplexers. The test cells are used to control and observe multiple partitioning points, while the multiplexers expand the controllability and observability provided by the test cells. The feasibility and efficiency of our algorithm are evaluated by partitioning numerous ISCAS 1985 and 1989 benchmark circuits containing up to 5597 gates. Our results show that the PIFAN algorithm offers significant reductions in overhead and test time when compared to previous partitioning algorithms.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:8 ,  Issue: 6 )