By Topic

Enhancement of the ETP model: how to calculate BER due to ISI for wide-band digital transmission in Nakagami-Rice fading environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Y. Karasawa ; Dept. of Electron. Eng., Univ. of Electro-Commun., Tokyo, Japan ; H. Iwai

The equivalent transmission-path model, which was proposed by the authors, has a function to assess the bit error rate (BER) due to intersymbol interference (ISI) in a Nakagami-Rice fading environment with a simple formula. In this paper, improvement of usability is pursued taking the similarity of BER map shape in the delay difference between two waves into account. Moreover, an extended method predicting overall BER and frame error rate (FER) affected by both thermal noise and ISI is proposed, and accuracy is evaluated by computer simulation. Finally, a self-consistent flowchart showing how to calculate overall BER and FER in Nakagami-Rice fading environments is presented

Published in:

IEEE Transactions on Vehicular Technology  (Volume:49 ,  Issue: 6 )