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A novel W-band spectrometer for dielectric measurements

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3 Author(s)
Afsar, M.N. ; Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA ; Tkachov, I.I. ; Kocharyan, K.N.

A new spectrometer for the precision measurement of dielectric permittivity and loss tangent is presented. The new instrument is capable of providing high-resolution data for the first time over an extended W-band (68-118 GHz) frequency for specimens with a large range of absorption values, including highly absorbing specimens that otherwise would not be possible. A novel technique based on the unbalanced bridge is developed for the measurement of the phase of the wave passed through the specimen in free space (quasi-optical) with reference provided by a waveguide arm. Specially constructed precision waveguide and quasi-optical components allowed reliable broadband operation. A number of common dielectrics are measured, and results are compared with previously reported data

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:48 ,  Issue: 12 )