Referenced Items are not available for this document.
The residual phase noise of a PHEMT device is studied in two unusual configurations: in transmission mode with a low input microwave power on the device, and in reflection mode. Measurements clearly reveal some fundamental aspects of the phase noise generation in this device: the phase noise is a modulation mechanism which still exists in the linear regime and in which the gate reactance fluctuations play an important role
Published in:
Electronics Letters
(Volume:37
,
Issue:
2
)
Date of Publication: 18 Jan 2001
- Page(s):
- 127 - 129
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 6834042
- Digital Object Identifier :
- 10.1049/el:20010081
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 August 2002
- Issue Date :
- 18 Jan 2001
- Sponsored by :
- Institution of Engineering and Technology
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