Cart (Loading....) | Create Account
Close category search window
 

An integrated approach to accelerate data and predicate computations in hyperblocks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Eichenberger, A. ; North Carolina State Univ., Raleigh, NC, USA ; Meleis, W. ; Maradani, S.

To exploit increased instruction-level parallelism available in modern processors, we describe the formation and optimization of tracenets, an integrated approach to reducing the length of the critical path in data and predicated computation. By tightly integrating selective path expansion and path optimization within hyperblocks, our algorithm is able to produce highly optimized code without exploring the exponentially large number of paths included in a hyperblock. Our approach extracts more of the implicit predicate correlations in hyperblocks and uses a precise model of predicate correlations to aggressively accelerate data and predicate computations. Experimental results indicate that tracenets can significantly reduce the number of dynamic execution cycles

Published in:

Microarchitecture, 2000. MICRO-33. Proceedings. 33rd Annual IEEE/ACM International Symposium on

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.