The use of genetic algorithms in validating the system model and determining worst-case transients in capacitor switching simulation studies

This paper presents two applications of the genetic algorithm (GA) for capacitor switching simulation studies, namely validation of the system model and determination of the worst case transients. For validating the system model, using both recorded and simulated data seems to be an efficient way. By modifying the system parameters, replaying the captured event, obtaining simulated waveforms, and comparing the simulated and recorded waveforms, the accuracy of the system model may be scrutinized and enhanced. For determining the worst case transients due to the capacitor switching, we are interested in the high frequency content, voltage peak value and transient duration. This paper proposes genetic algorithm based approaches for addressing both of the issues. Analysis results using data contributed by the sponsoring utilities are reported.