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Radiation damage and single event effect results for candidate spacecraft electronics

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19 Author(s)
O'Bryan, M.V. ; Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA ; LaBel, K.A. ; Reed, R.A. ; Howard, J.W.
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We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates (0.003-4.52 rads(Si)/s). Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others

Published in:

Radiation Effects Data Workshop, 2000

Date of Conference:

2000