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Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

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4 Author(s)
McClure, S.S. ; Hughes Space & Commun. Co., El Segundo, CA, USA ; Gorelick, J.L. ; Pease, R. ; Johnston, A.H.

Total dose tests of six different low dropout voltage regulators show sensitivity to both dose rate and bias during exposure. All devices tested exhibited Enhanced Low Dose Rate Sensitivity (ELDRS) and performed worse for the unbiased irradiation condition. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact on hardness assurance methodology is discussed

Published in:

Radiation Effects Data Workshop, 2000

Date of Conference:

2000