Close category search window
 

Wired Worlds: Exploring the Digital Frontier. A pioneering gallery of digital media discovery

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

The National Museum of Photography, Film and Television is Britain's leading center for lens-based media. To provide a strengthened platform for the 21st Century, the museum created a new flagship gallery that explores and addresses the importance of digital media. “Wired Worlds: Exploring the Digital Frontier” uses innovative presentational and communication approaches to describe the distinctive nature, styles and techniques of digital media. The 500-m 2 gallery took nearly three years and $2.2 million to complete. To address the challenges of an evolving field, we adopted an intensive, organic research and development approach. We organized a creative/curatorial project team, 10 contracted international digital media artists and developers, and a London-based design studio. We also consulted with other media professionals, academics and partnership companies

Published in:
Computer Graphics and Applications, IEEE  (Volume:21 ,  Issue: 1 )

Date of Publication: Jan/Feb 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.