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Collection and analysis of microprocessor design errors

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3 Author(s)
Van Campenhout, D. ; Versity Design, Mountain View, CA, USA ; Mudge, T. ; Hayes, J.P.

Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort

Published in:

Design & Test of Computers, IEEE  (Volume:17 ,  Issue: 4 )

Date of Publication:

Oct-Dec 2000

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