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Effectiveness of microarchitecture test program generation

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3 Author(s)
Utamaphethai, N. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Blanton, R.D. ; Shen, J.P.

Investigation of a list of design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detect them. Two metrics, functional and timing deviation are used to determine design error coverage

Published in:

Design & Test of Computers, IEEE  (Volume:17 ,  Issue: 4 )