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Test development for a third-version ColdFire microprocessor

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5 Author(s)
Crouch, A.L. ; Semicond. Products Sector, Motorola Inc., Austin, TX, USA ; Mateja, M. ; McLaurin, T.L. ; Potter, J.C.
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The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results

Published in:

Design & Test of Computers, IEEE  (Volume:17 ,  Issue: 4 )