By Topic

A new approach to detect-mitigate-correct radiation-induced faults for SRAM-based FPGAs in aerospace application

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yanmei Li ; Dept. of Electron. Eng., Tsinghua Univ., Beijing, China ; Dongmei Li ; Zhihua Wang

In aerospace applications, the Field Programmable Gate Array (FPGA) is attractive for its distinct advantages - simplicity and flexibility. But radiation-induced faults, especially Single Event Upsets (SEUs), may cause serious damage to SRAM-based FPGAs and even to the whole system. To restrain the consequences of SEUs and recover the system from radiation-induced faults, a hierarchical detection-mitigation-correction methodology based on XC4000 series FPGAs is introduced in this paper. The following techniques are included: fault identification and mitigation, soft-fault judgement and correction, hard-fault location and bypass. The effectiveness of our approach is proved through experiment and simulation. Such a detection-mitigation-correction methodology can cover almost all radiation-induced soft and hard faults and mitigate the effects of SEUs for general SRAM-based FPGAs without interrupting normal operations of the whole system

Published in:

National Aerospace and Electronics Conference, 2000. NAECON 2000. Proceedings of the IEEE 2000

Date of Conference: