By Topic

How to predict software defect density during proposal phase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

The author has developed a method to predict defect density based on empirical data. The author has evaluated the software development practices of 45 software organizations. Of those, 17 had complete actual observed defect density to correspond to the observed development practices. The author presents the correlation between these practices and defect density in this paper. This correlation can and is used to: (a) predict defect density as early as the proposal phase, (b) evaluate proposals from subcontractors, (c) perform tradeoffs so as to minimize software defect density. It is found that as practices improve, defect density decreases. Contrary to what many software engineers claim, the average probability of a late delivery is less on average for organizations with better practices. Furthermore, the margin of error in the event that a schedule is missed was smaller on average for organizations with better practices. It is also interesting that the average number of corrective action releases required is also smaller for the organizations with the best practices. This means less downtime for customers. It is not surprising that the average SEI CMM level is higher for the organizations with the better practices

Published in:

National Aerospace and Electronics Conference, 2000. NAECON 2000. Proceedings of the IEEE 2000

Date of Conference: