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Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis

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2 Author(s)
Jiun-Lang Huang ; Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA ; Kwang-Ting Cheng

Delta-sigma modulation has become popular in modern analog-to-digital modulator design due to its relatively high immunity from process variations. We propose efficient characterization techniques to obtain the key performance parameters of the 1-bit first-order delta-sigma modulator which is intended to be used as an on-chip analog signal digitizer for BIST applications. Numerical simulations have been performed to validate the techniques and the results indicate that accurate estimation of the parameters can be obtained at the presence of noise

Published in:
Test Conference, 2000. Proceedings. International

Date of Conference: 2000

Page(s):
1021 - 1030
Meeting Date :
03 Oct 2000-05 Oct 2000
ISSN :
1089-3539
Print ISBN:
0-7803-6546-1
INSPEC Accession Number:
6859194
Conference Location :
Atlantic City, NJ
Digital Object Identifier :
10.1109/TEST.2000.894315

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