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Challenges of high supply currents during VLSI test

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1 Author(s)
Johnson, G.H. ; Teradyne Inc., Fridley, MN, USA

Very high power supply currents required during test of advanced VLSI parts pose problems for both the ATE power supply and the interconnect to the DUT. Power supply design, inductance, resistance, filter capacitance and sense points all become critical. Design of the DUT interface board requires careful attention to detail

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference: