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Jitter measurements of a PowerPCTM microprocessor using an analytic signal method

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7 Author(s)
Yamaguchi, T.J. ; Advantest Labs. Ltd., Miyagi, Japan ; Soma, M. ; Halter, D. ; Nissen, J.
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This paper demonstrates a new method for measuring both peak-to-peak and RMS jitter in PLL output signals. The theoretical basis for this method is derived from analytic signal theory. To validate the method, experimental data from PowerPCTM microprocessor jitter measurements is compared with results obtained with the conventional time interval analyzer (TIA) technique

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000