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Register-transfer level fault modeling and test evaluation techniques for VLSI circuits

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3 Author(s)
Thaker, P.A. ; Hughes Network Syst. Inc., Germantown, MD, USA ; Agrawal, V.D. ; Zaghloul, M.E.

Stratified fault sampling is used in RTL fault simulation to estimate the gate-level fault coverage of given test patterns. RTL fault modeling and fault injection algorithm are developed such that the RTL fault list of a module can be treated as a representative fault sample of the collapsed stuck-at fault set of the module. The RTL coverage for the module is experimentally found to track the gate-level coverage within the statistical error bounds. For a VLSI system, consisting of several modules, the overall coverage is a weighted sum of RTL module coverages. Several techniques are proposed to determine these weights, known as stratum weights. For a system timing controller ASIC, the stratified RTL coverage of verification test-benches was estimated within 0.6% of the actual gate-level coverage. This ASIC consists of 40 modules (9,000 lines of Verilog HDL) that are synthesized into 17,126 equivalent logic gates by a commercial synthesis tool. Similar results on two other VLSI systems are reported

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000