Referenced Items are not available for this document.
This paper describes an approach to testing DDR echo clock outputs and transfer data specifications. Tester accuracy issues create difficulty in guaranteeing the 200 ps spec timing between these two groups of outputs. This approach will find the balance between accurate testing and test costs
Published in:
Test Conference, 2000. Proceedings. International
Date of Conference: 2000
- Page(s):
- 610 - 618
- Meeting Date :
- 03 Oct 2000-05 Oct 2000
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-6546-1
- INSPEC Accession Number:
- 6859147
- Conference Location :
- Atlantic City, NJ
- Digital Object Identifier :
- 10.1109/TEST.2000.894255
- Product Type:
- Conference Publications
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