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Bridging the gap between embedded test and ATE

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4 Author(s)
M. Bell ; LogicVision Inc., San Jose, CA, USA ; G. Danialy ; M. Howells ; S. Pateras

This paper presents a methodology and software system architecture that enable conventional test equipment to take full advantage of embedded test structures implemented within the device under test. The proposed methodology provides a seamless transfer of embedded test related information from the design engineering to the manufacturing test environment, allowing for automated control of the embedded test for production go/no-go testing as well as advanced failure diagnosis

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000