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Partitioning sequential circuits for pseudoexhaustive testing

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3 Author(s)
B. Shaer ; Dept. of Electr. & Comput. Eng., Minnesota Univ., Duluth, MN, USA ; S. A. Al-Arian ; D. Landis

In this paper, we present an algorithm for partitioning sequential circuits. This algorithm is based on an analysis of a circuit's primary input cones and fanout values (PIFAN), and it uses a directed acyclic graph to represent the circuit. An invasive approach is employed, which creates logical and physical partitions by automatically inserting reconfigurable test cells and multiplexers. The test cells are used to control and observe multiple partitioning points, while the multiplexers expand the controllability and observability provided by the test cells. The feasibility and efficiency of our algorithm are evaluated by partitioning numerous standard digital circuits, including some large benchmark circuits containing up to 5597 gates. Our algorithm is based upon pseudoexhaustive testing methods where fault simulation is not required for test-pattern generation and grading; hence, engineering design time and cost are further reduced.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:8 ,  Issue: 5 )