Close category search window
 

On the performance of software testing using multiple versions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Brilliant, S.S. ; Dept. of Math. Sci., Virginia Commonwealth Univ., Richmond, VA, USA ; Knight, J.C. ; Ammann, P.E.

The authors present analytic models of the performance of comparison checking (also called back-to-back testing and automatic testing), and they use these models to investigate its effectiveness. A Markov model is used to analyze the observation time required for a test system to uncover a fault using comparison checking. A basis for evaluation is provided by developing a similar Markov model for the analysis of ideal checking, i.e. using a perfect (through unrealizable) oracle. Also presented is a model of the effect of comparison checking on a version's failure probability as testing proceeds. Again, comparison checking is evaluated against ideal checking. The analyses show that comparison checking is a powerful and effective technique.<>

Published in:
Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium

Date of Conference: 26-28 June 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.