Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Concept of validation and its tool for intelligent systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Onoyama, T. ; Dept. of Res. & Dev., Hitachi Software Eng. Co. Ltd., Yokohama, Japan ; Oyanagi, K. ; Kubota, S. ; Tsuruta, S.

One problem in applying intelligent methods to real applications is to validate their expertise. Turing test approaches are useful in validating intelligent systems. Nevertheless, validation burdens experts with a heavy task. A concept called the “bi-directional, many-sided explanation typed multi-step validation method”, which enables the sharing of validation tasks among experts, knowledge engineers and computers, is proposed to diminish this load. The principal characteristics of the validation tool are as follows: 1) effective and anonymous bidirectional interactive functions by way of a virtual anonymous ID, which enables the protection of the experts' social position; 2) a response accelerator that greatly improves the responsiveness of many-sided explanations by providing an experts' validation server to fetch and store large volumes of information in advance; and 3) a validation process management function that detects delays in busy expert validation processes

Published in:

TENCON 2000. Proceedings  (Volume:1 )

Date of Conference: