Referenced Items are not available for this document.
This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results
Published in:
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Date of Conference: 2000
- Page(s):
- 78 - 83
- Meeting Date :
- 04 Dec 2000-06 Dec 2000
- ISSN :
- 1081-7735
- Print ISBN:
- 0-7695-0887-1
- INSPEC Accession Number:
- 6853123
- Conference Location :
- Taipei
- Digital Object Identifier :
- 10.1109/ATS.2000.893606
- Product Type:
- Conference Publications
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